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Simulating the cross section of inelastic scattering of electrons in layered structures on the basis of dielectric functions and experimental spectra of the film and substrate
Parshin, A. S., Kushchenkov, S. A., Pchelyakov, O. P., Mikhlin, Yu. L.Volume:
51
Journal:
Optoelectronics, Instrumentation and Data Processing
DOI:
10.3103/S8756699015040123
Date:
July, 2015
File:
PDF, 253 KB
2015