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[IEEE 2015 IEEE International Symposium on Electromagnetic Compatibility - EMC 2015 - Dresden, Germany (2015.8.16-2015.8.22)] 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC) - Uncertainty evaluation of conducted emission measurements by means of conformal mapping
Audone, Bruno, Finizio, Alberto F., Colombo, RobertoYear:
2015
DOI:
10.1109/ISEMC.2015.7256289
File:
PDF, 1.17 MB
2015