X-ray microtomography using correlation of near-field speckles for material characterization
I. Zanette, M. Zdora, T. Zhou, A. Burvall, D. H. Larsson, P. Thibault, H. M. Hertz, F. PfeifferYear:
2015
Language:
english
DOI:
10.1073/pnas.1502828112
File:
PDF, 1.07 MB
english, 2015