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Extraction of Position and Energy Level of Oxide Trap Generating Random Telegraph Noise in 65 nm NOR Flash Memory
Yang, Xiaonan, Liu, Jing, Zheng, Zhiwei, Wang, Yan, Jiang, Dandan, Wang, Zhongyong, Fan, Wenbing, Liu, MingVolume:
164
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584587.2015.1044884
Date:
July, 2015
File:
PDF, 848 KB
english, 2015