Test-Cost Modeling and Optimal Test-Flow Selection of...

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2015 / 9 Vol. 34; Iss. 9

Test-Cost Modeling and Optimal Test-Flow Selection of 3-D-Stacked ICs

Agrawal, Mukesh, Chakrabarty, Krishnendu
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Volume:
34
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2015.2419227
Date:
September, 2015
File:
PDF, 2.36 MB
english, 2015
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