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SPIE Proceedings [SPIE Applied Optics and Photonics China (AOPC2015) - Beijing, China (Tuesday 5 May 2015)] AOPC 2015: Optical Test, Measurement, and Equipment - Demountable dual-FOV zooming optical design for IR system
Han, Sen, Ellis, Jonathan D., Guo, Junpeng, Guo, Yongcai, Kang, Wenli, Wang, Nanxi, Gao, Jing, Zhang, Bo, Gao, ShanVolume:
9677
Year:
2015
Language:
english
DOI:
10.1117/12.2199679
File:
PDF, 298 KB
english, 2015