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SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 18 April 2011)] EUV and X-Ray Optics: Synergy between Laboratory and Space II - Performance benchmark of a gateable microchannel plate detector for extreme ultraviolet radiation with high temporal resolution
Hauck, Johannes, Freiberger, Ralf, Juschkin, Larissa, Hudec, René, Pina, LadislavVolume:
8076
Year:
2011
Language:
english
DOI:
10.1117/12.887017
File:
PDF, 1.11 MB
english, 2011