High-resolution electronic interferometry for the measurement of in-plane vibration
Chang, Ching-Yuan, Lin, Shih-Hao, Ma, Chien-ChingVolume:
51
Language:
english
Journal:
Applied Optics
DOI:
10.1364/AO.51.005773
Date:
August, 2012
File:
PDF, 995 KB
english, 2012