[IEEE ICC 2015 - 2015 IEEE International Conference on Communications - London, United Kingdom (2015.6.8-2015.6.12)] 2015 IEEE International Conference on Communications (ICC) - BER-based wear leveling and bad block management for NAND flash
Peleato, Borja, Tabrizi, Haleh, Agarwal, Rajiv, Ferreira, JeffreyYear:
2015
Language:
english
DOI:
10.1109/ICC.2015.7248337
File:
PDF, 539 KB
english, 2015