[IEEE 2015 IEEE International Vacuum Electronics Conference (IVEC) - Beijing, China (2015.4.27-2015.4.29)] 2015 IEEE International Vacuum Electronics Conference (IVEC) - Measurement of microwave dielectric properties of low loss diamond film at Ka band using the split-cylinder resonator method
Liu, Yanqing, Ding, Minghui, Su, Jingjie, She, Jianmin, Tang, WeizhongYear:
2015
Language:
english
DOI:
10.1109/IVEC.2015.7224031
File:
PDF, 558 KB
english, 2015