SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - Analysis of the sensitivity and resolution of the spectrometer in the field
Jiang, Ben-He, Chen, Wenyi, Jiang, Yun-Qing, Du, Sheng-Jun, Zhu, LiVolume:
2101
Year:
1993
Language:
english
DOI:
10.1117/12.156343
File:
PDF, 92 KB
english, 1993