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SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - Photoelastic tomography for residual stress measurement in glass
Aben, Hillar, Errapart, Andrei, Ainola, Leo, Anton, Johan, Osten, Wolfgang, Takeda, MitsuoVolume:
5457
Year:
2004
Language:
english
DOI:
10.1117/12.543778
File:
PDF, 592 KB
english, 2004