Scattered light imaging method (SLIM) for characterization...

Applied Optics 2014 / 07 Vol. 53; Iss. 20

Scattered light imaging method (SLIM) for characterization of arbitrary laser beam intensity profiles

Jorge, Kelly C., Riva, Rudimar, Rodrigues, Nicolau A. S., Sakamoto, João M. S., Destro, Marcelo G.
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Volume:
53
Language:
english
Journal:
Applied Optics
DOI:
10.1364/AO.53.004555
Date:
July, 2014
File:
PDF, 1.38 MB
english, 2014
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