Statistical analysis of void fluctuations in gas-liquid flows under 1 - g and μ - g conditions using a capacitance sensor
K.J. Elkow, K.S. RezkallahVolume:
23
Year:
1997
Language:
english
Pages:
14
DOI:
10.1016/s0301-9322(97)00021-9
File:
PDF, 1.12 MB
english, 1997