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[IEEE 2013 71st Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2013.06.23-2013.06.26)] 71st Device Research Conference - Optimization of the electron hole bilayer tunneling field effect transistor
Agarwal, Sapan, Teherani, James T., Hoyt, Judy L., Antoniadis, Dimitri A., Yablonovitch, EliYear:
2013
Language:
english
DOI:
10.1109/DRC.2013.6633817
File:
PDF, 747 KB
english, 2013