Atomic force microscopy investigation of dislocation...

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Atomic force microscopy investigation of dislocation structures and deformation characteristics in neutron irradiated silicon detectors

G. Golan, E. Rabinovich, A. Inberg, A. Axelevitch, M. Oksman, Y. Rosenwaks, A. Kozlovsky, P. Rancoita, M. Rattagi, A. Seidman, N. Croitoru
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Year:
1999
Language:
english
DOI:
10.1109/ICMEL.2000.840590
File:
PDF, 510 KB
english, 1999
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