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Long-term aging and quick stress-testing of 980-nm single-spatial mode lasers
M. Hempel, J. Tomm, D. Venables, V. Rossin, E. Zucker, T. ElsaesserYear:
2015
Language:
english
DOI:
10.1109/JLT.2015.2475605
File:
PDF, 724 KB
english, 2015