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Dynamic Curvature and Stress Studies for MBE CdTe on Si and GaAs Substrates
R. N. Jacobs, M. Jaime Vasquez, C. M. Lennon, C. Nozaki, L. A. Almeida, J. Pellegrino, J. Arias, C. Taylor, B. WissmanVolume:
44
Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-015-3822-5
Date:
September, 2015
File:
PDF, 776 KB
english, 2015