[IEEE 2015 IEEE 65th Electronic Components and Technology...

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[IEEE 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2015.5.26-2015.5.29)] 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - Void formation in Cu-Sn micro-connects

Ross, Glenn, Vuorinen, Vesa, Paulasto-Krockel, Mervi
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Year:
2015
Language:
english
DOI:
10.1109/ECTC.2015.7159907
File:
PDF, 1.46 MB
english, 2015
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