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[IEEE 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Pisa, Italy (2015.5.11-2015.5.14)] 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings - High frequency characterization and modeling via measurements of power electronic capacitors under high bias voltage and temperature variations
Hami, Fahim, Boulzazen, Habib, Kadi, MoncefYear:
2015
Language:
english
DOI:
10.1109/I2MTC.2015.7151290
File:
PDF, 855 KB
english, 2015