[IEEE 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Washington DC, USA (2015.9.9-2015.9.11)] 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Reliability aware simulation flow: From TCAD calibration to circuit level analysis
Hussin, Razaidi, Gerrer, Louis, Ding, Jie, Amaroso, Salvatore Maria, Wang, Liping, Semicic, Marco, Weckx, Pieter, Franco, Jacopo, Vanderheyden, Annelies, Vanhaeren, Danielle, Horiguchi, Naoto, Kaczer,Year:
2015
Language:
english
DOI:
10.1109/SISPAD.2015.7292281
File:
PDF, 1.43 MB
english, 2015