[IEEE 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Washington DC, USA (2015.9.9-2015.9.11)] 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Hierarchical variability-aware compact models of 20nm bulk CMOS
Wang, Xingsheng, Reid, Dave, Wang, Liping, Burenkov, Alex, Millar, Campbell, Lorenz, Juergen, Asenov, AsenYear:
2015
Language:
english
DOI:
10.1109/SISPAD.2015.7292325
File:
PDF, 1003 KB
english, 2015