[IEEE 2015 International Conference on Simulation of...

  • Main
  • [IEEE 2015 International Conference on...

[IEEE 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Washington DC, USA (2015.9.9-2015.9.11)] 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Hierarchical variability-aware compact models of 20nm bulk CMOS

Wang, Xingsheng, Reid, Dave, Wang, Liping, Burenkov, Alex, Millar, Campbell, Lorenz, Juergen, Asenov, Asen
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2015
Language:
english
DOI:
10.1109/SISPAD.2015.7292325
File:
PDF, 1003 KB
english, 2015
Conversion to is in progress
Conversion to is failed