Analysis and Simulation of AC-Biased TES Circuits

IEEE Transactions on Appiled Superconductivity 2015 / 10 Vol. 25; Iss. 5

Analysis and Simulation of AC-Biased TES Circuits

Wang, Tian-Shun, Chen, Jun-Kang, Zhou, Xingxiang
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Volume:
25
Language:
english
Journal:
IEEE Transactions on Applied Superconductivity
DOI:
10.1109/TASC.2015.2470668
Date:
October, 2015
File:
PDF, 1.88 MB
english, 2015
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