![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 7 February 2015)] Ultrafast Phenomena and Nanophotonics XIX - A spectroscopic ruler for intermediate-zone FRET measurements
Betz, Markus, Elezzabi, Abdulhakem Y., Tsen, Kong-Thon, Jones, Garth A., Andrews, David L.Volume:
9361
Year:
2015
Language:
english
DOI:
10.1117/12.2076913
File:
PDF, 261 KB
english, 2015