SPIE Proceedings [SPIE Applied Optics and Photonics China...

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SPIE Proceedings [SPIE Applied Optics and Photonics China (AOPC2015) - Beijing, China (Tuesday 5 May 2015)] AOPC 2015: Optical Test, Measurement, and Equipment - Backscattering analysis in optical micro-resonators with mode splitting based on COMSOL

Han, Sen, Ellis, Jonathan D., Guo, Junpeng, Guo, Yongcai, Yang, Zhaohua, Huo, Jiayan, Yang, Xu
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Volume:
9677
Year:
2015
Language:
english
DOI:
10.1117/12.2196993
File:
PDF, 465 KB
english, 2015
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