SPIE Proceedings [SPIE Applied Optics and Photonics China...

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SPIE Proceedings [SPIE Applied Optics and Photonics China (AOPC2015) - Beijing, China (Tuesday 5 May 2015)] AOPC 2015: Optical Test, Measurement, and Equipment - Analysis of the super-sensitivity of N00N and M&M' states under atmospheric influence

Han, Sen, Ellis, Jonathan D., Guo, Junpeng, Guo, Yongcai, Xu, Shi-long, Hu, Yi-hua, Zhao, Nan-xiang, Li, Le, Zhao, Xin-ying
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Volume:
9677
Year:
2015
Language:
english
DOI:
10.1117/12.2202932
File:
PDF, 1.30 MB
english, 2015
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