A sample scanning system with nanometric accuracy for...

A sample scanning system with nanometric accuracy for quantitative SPM measurements

G.B Picotto, M Pisani
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Volume:
86
Year:
2001
Language:
english
Pages:
8
DOI:
10.1016/s0304-3991(00)00112-1
File:
PDF, 440 KB
english, 2001
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