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A method for estimating the CTF in electron microscopy based on ARMA models and parameter adjustment
J.A. Velázquez-Muriel, C.O.S. Sorzano, J.J. Fernández, J.M. CarazoVolume:
96
Year:
2003
Language:
english
Pages:
19
DOI:
10.1016/s0304-3991(02)00377-7
File:
PDF, 1011 KB
english, 2003