Probing nanoscale surface enhanced Raman-scattering fluctuation dynamics using correlated AFM and confocal ultramicroscopy
Yung Doug Suh, Gregory K. Schenter, Leyun Zhu, H.Peter LuVolume:
97
Year:
2003
Language:
english
Pages:
14
DOI:
10.1016/s0304-3991(03)00033-0
File:
PDF, 529 KB
english, 2003