Studies of tip wear processes in tapping mode™ atomic force...

Studies of tip wear processes in tapping mode™ atomic force microscopy

Chanmin Su, Lin Huang, Kevin Kjoller, Ken Babcock
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Volume:
97
Year:
2003
Language:
english
Pages:
10
DOI:
10.1016/s0304-3991(03)00038-x
File:
PDF, 679 KB
english, 2003
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