A method of using the incident beam tilt as a eucentric goniometer in transmission electron microscopy
O. Vingsbo, T. Yanaka, K. ShirotaVolume:
1
Year:
1975
Language:
english
Pages:
6
DOI:
10.1016/s0304-3991(75)80014-3
File:
PDF, 10.57 MB
english, 1975