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Ultrafast measurement in GaAs thin films using NSOM
Steve Smith, Niels Christian Roemer Holme, Brad Orr, Raoul Kopelman, Ted NorrisVolume:
71
Year:
1998
Language:
english
Pages:
11
DOI:
10.1016/s0304-3991(97)00062-4
File:
PDF, 356 KB
english, 1998