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Are artefacts in scanning near-field optical microscopy related to the misuse of shear force?
R.L Williamson, L.J Brereton, M Antognozzi, M.J MilesVolume:
71
Year:
1998
Language:
english
Pages:
11
DOI:
10.1016/s0304-3991(97)00078-8
File:
PDF, 588 KB
english, 1998