A study of semiconductor surfaces and devices by coupled IR photon tunneling and atomic-force microscopy
P. Gall-Borrut, M. Castagne, J.L. Weyher, J.P. Fillard, J. BonnafeVolume:
71
Year:
1998
Language:
english
Pages:
4
DOI:
10.1016/s0304-3991(97)00079-x
File:
PDF, 219 KB
english, 1998