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Quantitative determination of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy
M. Foeth, P. Stadelmann, P.-A. BuffatVolume:
75
Year:
1999
Language:
english
Pages:
11
DOI:
10.1016/s0304-3991(98)00060-6
File:
PDF, 318 KB
english, 1999