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Atomic force microscopy for the analysis of environmental particles
Kathryn A Ramirez-Aguilar, David W Lehmpuhl, Amy E Michel, John W Birks, Kathy L RowlenVolume:
77
Year:
1999
Language:
english
Pages:
8
DOI:
10.1016/s0304-3991(99)00048-0
File:
PDF, 299 KB
english, 1999