Tapping-mode atomic force microscopy on intact cells:...

Ultramicroscopy 2000 Vol. 82; Iss. 1-4

Tapping-mode atomic force microscopy on intact cells: optimal adjustment of tapping conditions by using the deflection signal

Véronique Vié, Marie-Cécile Giocondi, Eric Lesniewska, Eric Finot, Jean-Pierre Goudonnet, Christian Le Grimellec
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Volume:
82
Year:
2000
Language:
english
Pages:
10
DOI:
10.1016/s0304-3991(99)00137-0
File:
PDF, 690 KB
english, 2000
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