[IEEE 2015 International Conference on Microelectronic Test Structures (ICMTS) - Tempe, AZ, USA (2015.3.23-2015.3.26)] Proceedings of the 2015 International Conference on Microelectronic Test Structures - Silicon measurements of characteristics for passgate/pull-down/pull-up MOSs and search MOS in a 28 nm HKMG TCAM bitcell
Nii, Koji, Yamaguchi, Kenji, Yabuuchi, Makoto, Watanabe, Naoya, Hasegawa, Takumi, Yoshida, Shoji, Okagaki, Takeshi, Yokota, Miho, Onozawa, KazunoriYear:
2015
Language:
english
DOI:
10.1109/ICMTS.2015.7106140
File:
PDF, 1.74 MB
english, 2015