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Geometry-Aware Single-Event Enabled Compact Models for Sub-50 nm Partially Depleted Silicon-on-Insulator Technologies
Kauppila, Jeffrey S., Massengill, Lloyd W., Ball, Dennis R., Alles, Michael L., Schrimpf, Ronald D., Loveless, T. Daniel, Maharrey, Jeffrey A., Quinn, Rachel C., Rowe, Jason D.Volume:
62
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2015.2443116
Date:
August, 2015
File:
PDF, 1.08 MB
english, 2015