![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Automated Visual Inspection and Machine Vision - Fast interframe transformation with local binary patterns
Beyerer, Jürgen, Puente León, Fernando, Vishnyakov, Boris V., Gorbatsevich, Vladimir S., Sidyakin, Sergey V.Volume:
9530
Year:
2015
Language:
english
DOI:
10.1117/12.2184465
File:
PDF, 876 KB
english, 2015