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SPIE Proceedings [SPIE Optomechatronic Technologies 2005 - Sapporo, Japan (Monday 5 December 2005)] Optomechatronic Sensors and Instrumentation - Development of DMD reflection-type CCD camera for phase analysis and shape measurement
Ri, Shien, Matsunaga, Yasuhiro, Fujigaki, Motoharu, Matui, Toru, Morimoto, Yoshiharu, Takaya, YasuhiroVolume:
6049
Year:
2005
Language:
english
DOI:
10.1117/12.647938
File:
PDF, 2.37 MB
english, 2005