Atomic force microscope, molecular imaging, and analysis

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  • 2015 / 07
  • Atomic force microscope, molecular imaging, and analysis
Journal of Molecular Recognition 2015 / 07

Atomic force microscope, molecular imaging, and analysis

Chen, Shu-wen W., Teulon, Jean-Marie, Godon, Christian, Pellequer, Jean-Luc
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Language:
english
Journal:
Journal of Molecular Recognition
DOI:
10.1002/jmr.2491
Date:
July, 2015
File:
PDF, 1.11 MB
english, 2015
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