Identification of intra-grain and grain boundary defects in...

physica status solidi (RRL) - Rapid Research Letters 2013 / 11 Vol. 7; Iss. 11

Identification of intra-grain and grain boundary defects in polycrystalline Si thin films by electron paramagnetic resonance

Sontheimer, Tobias, Schnegg, Alexander, Steffens, Simon, Ruske, Florian, Amkreutz, Daniel, Lips, Klaus, Rech, Bernd
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Volume:
7
Language:
english
Journal:
physica status solidi (RRL) - Rapid Research Letters
DOI:
10.1002/pssr.201308061
Date:
November, 2013
File:
PDF, 480 KB
english, 2013
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