SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Fourth Generation X-Ray Sources and Optics II - Present state of the art in undulator technology
Gottschalk, Steve C., Biedron, Sandra G., Eberhardt, Wolfgang, Ishikawa, Tetsuya, Tatchyn, Roman O.Volume:
5534
Year:
2004
Language:
english
DOI:
10.1117/12.560076
File:
PDF, 479 KB
english, 2004