SPIE Proceedings [SPIE SPIE Optical Systems Design - Jena, Germany (Monday 7 September 2015)] Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V - Analysis of factors important for measurements of focal length of optical systems
Duparré, Angela, Geyl, Roland, Pokorný, P., Opat, J., Mikš, A., Novák, J., Novák, P.Volume:
9628
Year:
2015
Language:
english
DOI:
10.1117/12.2191401
File:
PDF, 818 KB
english, 2015