Analysis of structural–technological limitations in silicon...

Analysis of structural–technological limitations in silicon circuits for reading photodiode signals in the IR region

Vasiliev, V. V., Kozlov, A. I., Marchishin, I. V., Sidorov, Yu. G., Yakushev, M. V.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
81
Language:
english
Journal:
Journal of Optical Technology
DOI:
10.1364/JOT.81.000392
Date:
July, 2014
File:
PDF, 1.62 MB
english, 2014
Conversion to is in progress
Conversion to is failed