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[IEEE Proceedings of the 2004 IEEE International Conference on Solid Dielectrics, 2004. ICSD 2004. - Toulouse, France (2004.07.5-2004.07.9)] Proceedings of the 2004 IEEE International Conference on Solid Dielectrics, 2004. ICSD 2004. - Correlation between activation parameters of dielectric relaxations and crystallinity rate of PEN
Zouzou, N., Martinez-Vega, J.J.Year:
2004
Language:
english
DOI:
10.1109/ICSD.2004.1350301
File:
PDF, 290 KB
english, 2004