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SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Holography, Diffractive Optics, and Applications IV - Off-axis reflection digital holographic microscopy for micron structure tomography measurement
Cheng, Guofeng, Jiang, Zhuqing, Wang, Dayong, Ding, Maoluan, Cui, Huakun, Sheng, Yunlong, Yu, Chongxiu, Chen, LinsenVolume:
7848
Year:
2010
Language:
english
DOI:
10.1117/12.870092
File:
PDF, 1.58 MB
english, 2010