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Resist Materials for Extreme Ultraviolet Lithography: Toward Low-Cost Single-Digit-Nanometer Patterning
Ashby, Paul D., Olynick, Deirdre L., Ogletree, D. Frank, Naulleau, Patrick P.Volume:
27
Language:
english
Journal:
Advanced Materials
DOI:
10.1002/adma.201501171
Date:
October, 2015
File:
PDF, 1.02 MB
english, 2015