Resist Materials for Extreme Ultraviolet Lithography:...

Resist Materials for Extreme Ultraviolet Lithography: Toward Low-Cost Single-Digit-Nanometer Patterning

Ashby, Paul D., Olynick, Deirdre L., Ogletree, D. Frank, Naulleau, Patrick P.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
27
Language:
english
Journal:
Advanced Materials
DOI:
10.1002/adma.201501171
Date:
October, 2015
File:
PDF, 1.02 MB
english, 2015
Conversion to is in progress
Conversion to is failed