[IEEE 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hsinchu (2015.6.29-2015.7.2)] 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits - From VLSI to WLSI an introduction to 3D wafer level system integration
Chih Hang Tung,, Yu, DougYear:
2015
Language:
english
DOI:
10.1109/IPFA.2015.7224323
File:
PDF, 59 KB
english, 2015